Wuhan Electric Apparatus Research Institute

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EMC Laboratory

China EMC Laboratory supplier
EMC Laboratory supplier EMC Laboratory supplier EMC Laboratory supplier

Large Image :  EMC Laboratory

Product Details:

Place of Origin: Guangdong, China
Brand Name: Kinte
Model Number: EMC laboratory

Payment & Shipping Terms:

Minimum Order Quantity: 1
Price: Price base on test requirement which should talk directly.
Packaging Details: Pallet
Delivery Time: 150 days
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Detailed Product Description
Function: Electromagnetic Compatibility Test Of Household Appliance System: Harmonics And Flicker Testing System

EMC Laboratory

 

Part I: Overview

 

This scheme is formulated in terms of electromagnetic compatibility test of household appliances.

This scheme will conduct tests according to standards such as CISPR 11, CISPR 16-1-4, IEC 61000-3-2, ANSI C63.4 Immunity: IEC 61000-4-2, IEC 61000-4-3, IEC 61000-4-5, IEC 61000-4-6, IEC 61000-4-8 and IEC 61000-4-11.

 

II. Test requirement

Measurement of conducted disturbance, frequency range: 148.5kHz -30MHz

Measurement of radiated disturbance, frequency range: 30MHz-6GHz

Harmonics and flicker measurement based on criteria: IEC 61000-3-2/3

Measurement of immunity to conducted disturbance based on standards:

1. IEC 61000-4-2: Electrostatic Discharge Immunity Test

2. IEC 61000-4-4: Electrical Fast Transient Burst Immunity Test

3. IEC 61000-4-5: Surge (Impact) Immunity Test

4.IEC 61000-4-6: Immunity to Conducted Disturbances Induced by Radio-frequency Fields

5. IEC 61000-4-8: Power Frequency Magnetic Field Immunity Test

6. IEC 61000-4-11: Voltage Dips, Short Interruptions and Voltages Variations Immunity Tests

IV. System composition

The whole set of electromagnetic compatibility test system is composed of the following sub-systems:

Continuous interference test system (conduction)

Radiated disturbance test system

Testing system of immunity to conducted disturbances induced by radio-frequency fields

Testing system of immunity to transient conducted disturbance

Harmonics and flicker testing system

Detailed introduction of each sub-system shall be referred to in Party II.

 

Contact Details
Wuhan Electric Apparatus Research Institute

Contact Person: kinte

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